DocumentCode
3475638
Title
On sampling unit size in sampled microprocessor simulation
Author
Luo, Yue ; John, Lizy K.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
fYear
2005
fDate
7-9 April 2005
Firstpage
81
Lastpage
90
Abstract
In this paper, we use statistical theory to study the choice of sampling unit size with ideal warm-up. We find that most benchmarks exhibit positive intracluster correlation for most metrics. As a result, using larger sampling units is not as effective as using many small sampling units at improving the accuracy. We provide insight into the inherent property of the benchmarks that causes the positive intracluster correlation. Using the microarchitecture independent basic block vector distance we identified a generalized temporal locality that most benchmarks possess. We also observed that the uncommon benchmarks which lack the general code locality are candidates for using larger sampling units for some metrics. This work provides guidance for selecting sampling unit sizes in future research and offers evidence against the trend of simulating one larger and larger chunk of instructions.
Keywords
benchmark testing; microprocessor chips; sampling methods; benchmark; positive intracluster correlation; sampled microprocessor simulation; sampling unit size; statistical theory; Computational modeling; Computer simulation; Kernel; Microarchitecture; Microprocessors; Modems; Moore´s Law; Process design; Sampling methods; Terminology;
fLanguage
English
Publisher
ieee
Conference_Titel
Performance, Computing, and Communications Conference, 2005. IPCCC 2005. 24th IEEE International
ISSN
1097-2641
Print_ISBN
0-7803-8991-3
Type
conf
DOI
10.1109/PCCC.2005.1460523
Filename
1460523
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