Title : 
Impact of Monitoring Voltage on the Lifetime Extrapolation During the Accelerated Degradation Tests
         
        
            Author : 
Duan, Franklin ; Cooper, Stephen ; Marathe, Amit ; Zhang, John ; Jayanarayanan, Sankaran Kartik
         
        
            Author_Institution : 
AMD, Sunnyvale, CA
         
        
        
            fDate : 
Oct. 16 2006-Sept. 19 2006
         
        
        
        
            Abstract : 
During the accelerated stressing test, not only the stress voltage affects the lifetime extrapolation but also the monitoring voltage plays a considerable role. We have conducted a series of tests in various stress and monitoring voltages to quantify this impact. We have seen ~20 times difference on lifetime at monitoring voltages of 1.0V and 1.5V under a same stressed voltage. This difference should be taken into account to accurately predict the lifetime at normal use conditions from the data obtained in accelerated life test
         
        
            Keywords : 
extrapolation; life testing; stress effects; 1 V; 1.5 V; accelerated degradation tests; accelerated stressing test; lifetime extrapolation; monitoring voltage; stress voltage affects; CMOS technology; Circuit testing; Degradation; Extrapolation; Human computer interaction; Life estimation; Life testing; Monitoring; Stress; Voltage;
         
        
        
        
            Conference_Titel : 
Integrated Reliability Workshop Final Report, 2006 IEEE International
         
        
            Conference_Location : 
South Lake Tahoe, CA
         
        
        
            Print_ISBN : 
1-4244-0296-4
         
        
            Electronic_ISBN : 
1930-8841
         
        
        
            DOI : 
10.1109/IRWS.2006.305229