• DocumentCode
    3475909
  • Title

    Data retention time of a new composed cell for dynamic random access memory

  • Author

    Riho, Yoshiro ; Nakazato, Kazuo

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Nagoya Univ., Nagoya, Japan
  • fYear
    2013
  • fDate
    3-5 June 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Demand has been placed on systems that use a dynamic random access memory (DRAM) to not only increase the total capacity and data transfer speed but also reduce the operating and standby currents. Owing to data retention time restrictions, a refresh operation to rewrite data in memory cell capacitor is necessary, and power consumption for a refresh operation increases in proportion to the memory capacity. A new proposed method, partial access mode (PAM) is executed by conversion from 1 cell/bit to 2N cells/bit to reduce the refresh power consumption and the frequency of disturbance effectively extending the memory cell retention time. Conventional computer systems generate a new low-power mode PAM in which all conventional functions and operations are maintained as a full array access mode. The effect of PAM is expressed as the refresh operation interval which is 2N × 2N times longer than that of conventional full array access mode. The extension of refresh operation interval is proved by the data retention time of 2N cells/bit memory cell.
  • Keywords
    DRAM chips; low-power electronics; DRAM; composed cell; computer systems; data retention time; data transfer speed; dynamic random access memory; full array access mode; low-power mode PAM; memory capacity; memory cell capacitor; memory cell retention time; partial access mode; power consumption; refresh power consumption; ISO standards; Random access memory; Time-frequency analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
  • Conference_Location
    Hong Kong
  • Type

    conf

  • DOI
    10.1109/EDSSC.2013.6628104
  • Filename
    6628104