Title :
Calibrations of current-to-voltage transimpedance amplifiers using electrical standards
Author :
Yoon, Howard W. ; Eppeldauer, George P. ; Jarrett, Dean G. ; Larason, Thomas C. ; Kim, Wan-Seop
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
For photocurrent measurements with low uncertainties, a wide-dynamic range current-to-voltage converter traceable to resistance standards has been developed at the NIST. The design and calibration of the converter standard are described. For validation, the converter standard was compared to the low-current scale of KRISS.
Keywords :
calibration; convertors; operational amplifiers; KRISS; NIST; calibrations; converter standard; current-to-voltage transimpedance amplifiers; electrical standards; photocurrent measurements; resistance standards; wide-dynamic range current-to-voltage converter; Calibration; Current measurement; Electrical resistance measurement; Feedback; Immune system; Measurement standards; NIST; Radiometry; Resistors; Standards development;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
DOI :
10.1109/CPEM.2010.5544230
