DocumentCode
3475998
Title
Physical CAD changes to incorporate design for lithography and manufacturability
Author
Scheffer, L.K.
Author_Institution
Cadence Design Systems, Inc.
fYear
2004
fDate
27-30 Jan. 2004
Firstpage
768
Lastpage
773
Abstract
The next few process generations (65 nm and below) will have serious lithography and manufacturing constraints since the feature size is shrinking much more rapidly than the wavelengths used in manufacturing the chips. This paper starts with a quick tutorial on the Design for Manufacturability problems of these process generations, concentrating primarily on the limitations of optical lithography. The remainder of the talk covers the changes to physical design tools, such as placement and routing, that are needed to cope with these problems.
Keywords
Computer aided manufacturing; Design automation; Etching; Lithography; Manufacturing processes; Optical design; Optical materials; Pulp manufacturing; Routing; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Conference_Location
Yohohama, Japan
Print_ISBN
0-7803-8175-0
Type
conf
DOI
10.1109/ASPDAC.2004.1337697
Filename
1337697
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