DocumentCode
3476298
Title
Integrated identification and control for diffusion/CVD furnaces
Author
Tsakalis, Kostas ; Stoddard, Kevin
Author_Institution
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
fYear
1997
fDate
9-12 Sep 1997
Firstpage
514
Lastpage
519
Abstract
The paper describes an integrated approach for modeling and robust multivariable controller design, with application to temperature control of diffusion and CVD furnaces. The modeling relies on input-output data, collected in a preliminary identification experiment at the desired operating conditions. An important component of the identification is the computation of uncertainty bounds that describe the confidence limits of the model, in a manner consistent with robust control theory. The results of the identification are then used to design an H-infinity controller with a cascade, hierarchical structure. The final implementation of the controller also includes mechanisms to prevent integrator wind-up. Special emphasis is placed on automating the procedure-for classes of furnaces-so that, potentially, it can be used by nonexperts in the field. Implementations include several industrial furnaces. Experimental results demonstrate the success of the approach as well as a good agreement between predicted and actual closed-loop behavior
Keywords
H∞ control; cascade control; chemical vapour deposition; control system synthesis; diffusion; furnaces; hierarchical systems; integrated circuit manufacture; multivariable control systems; process control; robust control; semiconductor process modelling; temperature control; uncertain systems; CVD furnaces; H-infinity controller; H∞ control; I/O data; cascade hierarchical structure; closed-loop behavior; diffusion furnaces; identification; industrial furnaces; input-output data; integrator wind-up; modeling; robust multivariable controller design; semiconductor manufacturing industry; temperature control; uncertainty bounds; Automatic control; Furnaces; Paper technology; Resistance heating; Robust control; System identification; Temperature control; Temperature dependence; Temperature distribution; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Emerging Technologies and Factory Automation Proceedings, 1997. ETFA '97., 1997 6th International Conference on
Conference_Location
Los Angeles, CA
Print_ISBN
0-7803-4192-9
Type
conf
DOI
10.1109/ETFA.1997.616324
Filename
616324
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