DocumentCode :
3476364
Title :
Instrumenting embedded test software to support system integration, factory production and depot repair
Author :
Vash, John R.
fYear :
2001
fDate :
2001
Firstpage :
740
Lastpage :
745
Abstract :
Embedded built-in test (BIT) software typically provides a system-level go/no-go indication and, in the presence of a failure, may provide some level of sub-system isolation. This level of reporting, while meeting the customer\´s operational requirements, does little to support system integration, production and repair. To support these other needs "instrumentation code" is added to the BIT software to provide detailed test data through an external interface. Since the BIT software already accesses the hardware parameters for testing it becomes the most logical component for the instrumentation. This paper describes the techniques of embedding instrumentation during BIT design and development to support a broad range of program test needs. It explains the costs and benefits associated with the use of instrumentation. It gives specific examples of instrumented software. It also describes how the instrumentation data can be used during environmental tests, factory test, and depot test. The impact instrumentation has on software development time, code size, execution time, and reliability is discussed as well as the cost of retrofitting BIT software to add instrumentation. Some of the benefits as well as the challenges to developing effective embedded instrumentation are examined
Keywords :
automatic test software; built-in self test; cost-benefit analysis; maintenance engineering; production testing; program testing; software reliability; acceptance test; code size; depot test; embedded built-in test software; embedding instrumentation; environmental tests; execution time; factory test; instrumented software; maintainability; product repair cycle time; program test needs; retrofitting; software development time; software reliability; system integration; Built-in self-test; Embedded software; Hardware; Instruments; Logic testing; Production facilities; Production systems; Software systems; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location :
Valley Forge, PA
ISSN :
1080-7225
Print_ISBN :
0-7803-7094-5
Type :
conf
DOI :
10.1109/AUTEST.2001.949457
Filename :
949457
Link To Document :
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