• DocumentCode
    347649
  • Title

    Robust testability of primitive faults using test points

  • Author

    Tekumalla, Ramesh C. ; Menon, Prem R.

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    260
  • Lastpage
    268
  • Abstract
    Recent research has characterized a class of faults, called primitive faults, that must be tested to insure timing correctness of digital circuits. Experimental results have shown that a large fraction of primitive faults usually have only non-robust tests. In this paper, we propose a method of improving robust coverage of primitive faults using test point insertion. An important feature of the proposed method is that instead of considering primitive faults explicitly, single faults are analyzed to determine whether they can be members of robustly testable primitive faults. If not, test points are specified to make any primitive fault containing such faults robustly testable. Results of experiments to determine the effectiveness of the proposed method show significant improvements in fault coverage
  • Keywords
    combinational circuits; fault diagnosis; integrated circuit testing; logic testing; timing; combinational circuit; cube identification; digital circuits; fault coverage; primitive faults; robust coverage; robust testability; single faults analysis; test point insertion; test points; timing correctness; Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Delay; Design for testability; Fault diagnosis; Information analysis; Robustness; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805639
  • Filename
    805639