DocumentCode
347649
Title
Robust testability of primitive faults using test points
Author
Tekumalla, Ramesh C. ; Menon, Prem R.
Author_Institution
Intel Corp., Hillsboro, OR, USA
fYear
1999
fDate
1999
Firstpage
260
Lastpage
268
Abstract
Recent research has characterized a class of faults, called primitive faults, that must be tested to insure timing correctness of digital circuits. Experimental results have shown that a large fraction of primitive faults usually have only non-robust tests. In this paper, we propose a method of improving robust coverage of primitive faults using test point insertion. An important feature of the proposed method is that instead of considering primitive faults explicitly, single faults are analyzed to determine whether they can be members of robustly testable primitive faults. If not, test points are specified to make any primitive fault containing such faults robustly testable. Results of experiments to determine the effectiveness of the proposed method show significant improvements in fault coverage
Keywords
combinational circuits; fault diagnosis; integrated circuit testing; logic testing; timing; combinational circuit; cube identification; digital circuits; fault coverage; primitive faults; robust coverage; robust testability; single faults analysis; test point insertion; test points; timing correctness; Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Delay; Design for testability; Fault diagnosis; Information analysis; Robustness; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805639
Filename
805639
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