• DocumentCode
    3476515
  • Title

    On quality of test sets: relating fault coverage to defect coverage

  • Author

    D´souzat, A.L. ; Hsiao, Michael S.

  • Author_Institution
    Sun Microsystems, Sunnyvale, CA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    816
  • Lastpage
    825
  • Abstract
    The true quality of a test set can be evaluated by estimating its coverage of arbitrary defects. In evaluating the quality of test sets, test vectors were generated from different test generators. We estimate the corresponding defect coverages for these test sets of varying lengths, generated by different test generators. The coverage estimation is performed using a region based model, in which it is independent of specific, physical, fault models. Experimental results show that similar fault coverages of varying test set sizes yield similar defect coverage. Further, similar activity and observability levels were observed in spite of the fact that test sets were generated with different methods and had different sizes
  • Keywords
    integrated circuit testing; activity level; defect coverage; fault coverage; fault model; observability level; region based model; test generator; test set quality; test vector generation; Automatic test pattern generation; Circuit faults; Circuit testing; Compaction; Contracts; Fault detection; Observability; Performance evaluation; Sun; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
  • Conference_Location
    Valley Forge, PA
  • ISSN
    1080-7225
  • Print_ISBN
    0-7803-7094-5
  • Type

    conf

  • DOI
    10.1109/AUTEST.2001.949464
  • Filename
    949464