DocumentCode
3476515
Title
On quality of test sets: relating fault coverage to defect coverage
Author
D´souzat, A.L. ; Hsiao, Michael S.
Author_Institution
Sun Microsystems, Sunnyvale, CA, USA
fYear
2001
fDate
2001
Firstpage
816
Lastpage
825
Abstract
The true quality of a test set can be evaluated by estimating its coverage of arbitrary defects. In evaluating the quality of test sets, test vectors were generated from different test generators. We estimate the corresponding defect coverages for these test sets of varying lengths, generated by different test generators. The coverage estimation is performed using a region based model, in which it is independent of specific, physical, fault models. Experimental results show that similar fault coverages of varying test set sizes yield similar defect coverage. Further, similar activity and observability levels were observed in spite of the fact that test sets were generated with different methods and had different sizes
Keywords
integrated circuit testing; activity level; defect coverage; fault coverage; fault model; observability level; region based model; test generator; test set quality; test vector generation; Automatic test pattern generation; Circuit faults; Circuit testing; Compaction; Contracts; Fault detection; Observability; Performance evaluation; Sun; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location
Valley Forge, PA
ISSN
1080-7225
Print_ISBN
0-7803-7094-5
Type
conf
DOI
10.1109/AUTEST.2001.949464
Filename
949464
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