Title :
Testing a system-on-a-chip with embedded microprocessor
Author :
Rajsuman, Rochit
Author_Institution :
Advantest America R&D Center, Santa Clara, CA, USA
Abstract :
In this paper, we describe the test methodology for embedded cores based system-on-a-chip (SoC) which contains a microprocessor core. First the microprocessor core is tested for correctness of all the instructions and then the computation power of the microprocessor core is used to test the on-chip memories and other cores, A small Iddq test set is also used to detect physical defects. The design features to facilitate Iddq testing are described
Keywords :
automatic testing; built-in self test; computer equipment testing; electric current measurement; embedded systems; integrated circuit testing; integrated memory circuits; logic testing; microprocessor chips; Iddq test; computation power; design features; embedded microprocessor; microprocessor core; on-chip memories; physical defects; system-on-a-chip; Built-in self-test; Computer aided instruction; Counting circuits; Decoding; Logic design; Logic testing; Microprocessors; Registers; System testing; System-on-a-chip;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805773
