BITE availability under operational constraints

Author

Moreno, Frank J.

Author_Institution

Harris Corp., Melbourne, FL, USA

fYear

1989

fDate

24-26 Jan 1989

Firstpage

66

Lastpage

68

Abstract

An operational system (OS) supported by a built-in test equipment (BITE) string is embedded in an operating environment that requires a high level of OS and BITE string availability. The BITE string availability expression is derived using a model with operational constraints posed by both the OS requirements and the support-logistics system. The resultant BITE availability expression is formulated as a function of the BITE string MTBF, mean fault detection delay of the BITE string test scenario and the mean logistics delay of the support system. The OS availability requirement/specifications is partitioned into the constituent elements of MTBF and MTTR where the fault isolation time element of MTTr is coupled to the BITE string availability. BITE availability calculations are subsequently carried out using the developed methodology

Keywords

electronic equipment testing; failure analysis; fault location; BITE; MTBF; MTTR; built-in test equipment; fault isolation time; mean fault detection delay; operational constraints; string availability; support-logistics system; Availability; Delay effects; Delay estimation; Fault detection; Logistics; Steady-state; Stress; System testing; Test equipment; Time factors;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability and Maintainability Symposium, 1989. Proceedings., Annual

Conference_Location

Atlanta, GA

Type

conf

DOI

10.1109/ARMS.1989.49576

Filename

49576