Title :
120 V super junction LDMOS transistor
Author :
Panigrahi, Sunil Kumar ; Baghini, Maryam Shojaei ; Gogineni, Usha ; Iravani, Farshid
Author_Institution :
Electr. Eng. Dept., IIT-Bombay, Mumbai, India
Abstract :
Super junction (SJ) is one of the emerging principles used in high-voltage high-power semiconductor devices. Implementation of SJ principle with charge balance in the pillars has overcome the “Silicon-limit”. SJ principle demands formation of back-to-back reverse biased p-n pillars. Main technology constraint is formation of narrow pillars with high aspect ratio and charge imbalance in these pillars. We propose a method to obtain high breakdown voltage in planar SJ-LDMOS by reducing the effect of charge imbalance at the drain end without reducing width of the pillars and no significant change in ION. The breakdown voltage of 120 V in a HV CMOS technology with tox of 13nm is achieved without ION degradation, as compared to 100 V conventional LDMOS device.
Keywords :
CMOS integrated circuits; MOSFET; semiconductor device breakdown; HV CMOS technology; SJ principle; aspect ratio; back-to-back reverse biased p-n pillars; breakdown voltage; charge imbalance; high-voltage high-power semiconductor devices; main technology constraint; silicon-limit; super junction LDMOS transistor; voltage 120 V; Benchmark testing; CMOS integrated circuits; CMOS technology; Calibration; Simulation; TV; Transistors;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
Conference_Location :
Hong Kong
DOI :
10.1109/EDSSC.2013.6628135