DocumentCode :
347658
Title :
Analog Fault Simulation: Key to Product Quality, or a Foot in the Door
Author :
Force, Craig
Author_Institution :
Texas Instruments
fYear :
1999
fDate :
1999
Firstpage :
650
Lastpage :
650
Keywords :
Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Context modeling; Electronic design automation and methodology; Foot; Logic design; Logic testing; Signal design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805791
Filename :
805791
Link To Document :
بازگشت