Title :
Analog Fault Simulation: Key to Product Quality, or a Foot in the Door
Author_Institution :
Texas Instruments
Keywords :
Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Context modeling; Electronic design automation and methodology; Foot; Logic design; Logic testing; Signal design;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805791
