Title :
At-speed structural test
Author :
West, Burnell G.
Author_Institution :
Schlumberger ATE, San Jose, CA, USA
Abstract :
Structural test can address only stuck-at faults unless some dynamic capability is included. The dynamic capability required starts with two-vector launch-capture delay tests, but evolves rapidly to include gated clock bursts, perhaps synchronized with primary I/O´s. This implies an at-speed structural test architecture which incorporates many of the capabilities of functional test systems
Keywords :
failure analysis; fault diagnosis; integrated circuit testing; logic testing; timing; at-speed structural test; dynamic capability; functional test; gated clock bursts; logic testing; pattern generation; response; stuck-at faults; test architecture; timing; two-vector launch-capture delay tests; Clocks; Delay; Fixtures; Geometry; Hardware; Logic testing; Manufacturing processes; Power supplies; Synchronization; System testing;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805810
