Title :
A method to improve the performance of high-speed waveform digitizing
Author :
Asami, Koji ; Tajiri, Shinsuke
Author_Institution :
Advantest Corp., Gunma, Japan
Abstract :
One method for achieving high-speed waveform digitizing uses time-interleaved Analog-to-Digital Converters (ADC´s). Time interleaving with two or more ADC´s enables waveform digitizing at sampling rates proportionately faster than when using just one ADC. A well-known drawback of this method is that the misalignment of sampling instances degrades the achievable dynamic range. This paper proposes a solution that removes distortion caused by the alignment error with digital signal processing. Since the algorithm is realized as an extension to the ordinary FFT, the objective is achieved without significant loss of throughput
Keywords :
analogue-digital conversion; discrete Fourier transforms; error compensation; integrated circuit testing; signal sampling; waveform analysis; FFT extension; achievable dynamic range; digital signal processing; discrete FT; error compensation; high-speed waveform digitizing; mixed signal testers; performance improvement; quantization; time alignment error; time-interleaved ADC; waveform sampling rate; Analog-digital conversion; Clocks; Degradation; Frequency domain analysis; Interleaved codes; Quantization; Sampling methods; Signal processing algorithms; Signal sampling; Testing;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805827