• DocumentCode
    3476660
  • Title

    A methodology for addressing support equipment obsolescence [ATE]

  • Author

    Craig, Richard W.

  • Author_Institution
    Boeing Co., Seattle, WA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    913
  • Lastpage
    922
  • Abstract
    The rapid growth of technology over the last twenty years is providing vastly improved capabilities for both avionics and avionics test systems. Unfortunately, an environment of rapid technological growth breeds a corresponding environment of rapid technological obsolescence. Test systems developed fifteen years ago are becoming increasingly difficult to support due to obsolescence issues and, additionally, such a test system does not reflect the current state of the art for automatic test equipment. The ability of a test system to evolve is essential to providing cost-effective support systems for electronic systems. The F-15 Tactical Electronic Warfare System (TEWS) Intermediate Support System (TISS) was developed under the Modular Automatic Test Equipment (MATE) guidelines to support the suite of F-15 electronic warfare LRUs. MATE imposed hardware architecture constraints, which were factors that contributed to its abandonment. However, the modular aspect of MATE has provided a system that can easily evolve with technological advancements. Modularity is the cornerstone of modern software systems and this is the aspect that has been exploited in the evolution of the TISS
  • Keywords
    automatic test software; electronic warfare; military aircraft; military avionics; modules; peripheral interfaces; F-15 Tactical Electronic Warfare System; F-15 electronic warfare LRUs; MATE guidelines; MATE modular aspect; Modular Automatic Test Equipment guidelines; TEWS Intermediate Support System; TISS; automatic test equipment; avionics; avionics test systems; cost-effective support systems; electronic systems; hardware architecture constraints; modularity; software systems; support equipment obsolescence; technological growth; technological obsolescence; test system evolution; test systems; Aerospace electronics; Automatic test equipment; Automatic testing; Computer architecture; Electronic equipment testing; Electronic warfare; Guidelines; Hardware; Software systems; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
  • Conference_Location
    Valley Forge, PA
  • ISSN
    1080-7225
  • Print_ISBN
    0-7803-7094-5
  • Type

    conf

  • DOI
    10.1109/AUTEST.2001.949471
  • Filename
    949471