• DocumentCode
    3476683
  • Title

    Adaptive on-line software aging prediction based on machine learning

  • Author

    Alonso, Javier ; Torres, Jordi ; Berral, Josep Li ; Gavalda, Ricard

  • Author_Institution
    Dept. of Comput. Archit., Tech. Univ. of Catalonia, Barcelona, Spain
  • fYear
    2010
  • fDate
    June 28 2010-July 1 2010
  • Firstpage
    507
  • Lastpage
    516
  • Abstract
    The growing complexity of software systems is resulting in an increasing number of software faults. According to the literature, software faults are becoming one of the main sources of unplanned system outages, and have an important impact on company benefits and image. For this reason, a lot of techniques (such as clustering, fail-over techniques, or server redundancy) have been proposed to avoid software failures, and yet they still happen. Many software failures are those due to the software aging phenomena. In this work, we present a detailed evaluation of our chosen machine learning prediction algorithm (M5P) in front of dynamic and non-deterministic software aging. We have tested our prediction model on a three-tier web J2EE application achieving acceptable prediction accuracy against complex scenarios with small training data sets. Furthermore, we have found an interesting approach to help to determine the root cause failure: The model generated by machine learning algorithms.
  • Keywords
    learning (artificial intelligence); program testing; software fault tolerance; J2EE; machine learning; software aging; software fault; software system; Aging; Clustering algorithms; Machine learning; Machine learning algorithms; Prediction algorithms; Predictive models; Redundancy; Software algorithms; Software systems; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-7500-1
  • Electronic_ISBN
    978-1-4244-7499-8
  • Type

    conf

  • DOI
    10.1109/DSN.2010.5544275
  • Filename
    5544275