DocumentCode :
347670
Title :
Changing our Path to High Level ATPG
Author :
Davidson, Scott
Author_Institution :
Sun Microsystems Inc.
fYear :
1999
fDate :
1999
Firstpage :
1114
Lastpage :
1114
Keywords :
Automatic test pattern generation; Search problems; Sun; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805849
Filename :
805849
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=347670
