DocumentCode :
3476729
Title :
Impact of new technology on repair
Author :
Neubauer, Roy E. ; Laird, William C.
Author_Institution :
Resource Consultants Inc., San Diego, CA, USA
fYear :
1989
fDate :
24-26 Jan 1989
Firstpage :
69
Lastpage :
73
Abstract :
The authors assert that complex integrated circuits will dominate the next generation circuit boards, subsystems, and systems. Visual inspection and similar techniques used in repairing circuit boards in the past cannot be applied to these complex systems; however, design features such as design for testability, built-in-test, and manufacturing processes such as pin-grid-array, surface-mounted, and socketed devices provide capabilities that should render fault isolation, testing, and component replacement less time consuming. These complex circuits are expensive, so that repair of the systems containing these circuits needs to be addressed by industry. The authors propose a repair philosophy is to develop long-range support requirements such as test/diagnostic equipments, training, logistics, and repair procedures for fleet equipment
Keywords :
electronic equipment testing; fault location; maintenance engineering; built-in-test; circuit boards; complex integrated circuits; component replacement; diagnostic equipments; fault isolation; fleet equipment; logistics; long-range support requirements; manufacturing processes; pin-grid-array; repair; repair procedures; socketed devices; subsystems; surface-mounted; systems; testability; testing; training; Circuit faults; Circuit testing; Design for testability; Industrial training; Inspection; Integrated circuit technology; Manufacturing industries; Manufacturing processes; Printed circuits; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1989. Proceedings., Annual
Conference_Location :
Atlanta, GA
Type :
conf
DOI :
10.1109/ARMS.1989.49577
Filename :
49577
Link To Document :
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