DocumentCode

347674

Title

SCITT: Bringing DRAMs Into the Test Fold

Author

Angelotti, Frank W.

Author_Institution

IBM Server Division

fYear

1999

fDate

1999

Firstpage

1139

Lastpage

1139

Keywords

Circuit testing; Costs; Crosstalk; Electronics industry; Packaging; Proposals; Random access memory; Registers; Switches; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1999. Proceedings. International

ISSN

1089-3539

Print_ISBN

0-7803-5753-1

Type

conf

DOI

10.1109/TEST.1999.805871

Filename

805871