مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

347674

Title :

SCITT: Bringing DRAMs Into the Test Fold

Author :

Angelotti, Frank W.

Author_Institution :

IBM Server Division

fYear :

1999

fDate :

1999

Firstpage :

1139

Lastpage :

1139

Keywords :

Circuit testing; Costs; Crosstalk; Electronics industry; Packaging; Proposals; Random access memory; Registers; Switches; System testing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1999. Proceedings. International

ISSN :

1089-3539

Print_ISBN :

0-7803-5753-1

Type :

conf

DOI :

10.1109/TEST.1999.805871

Filename :

805871

Link To Document :