DocumentCode
347675
Title
STIL: the device-oriented database for the test development lifecycle
Author
Biggs, Nathan
Author_Institution
Priority Technol. Inc., USA
fYear
1999
fDate
1999
Firstpage
1149
Abstract
STIL is uniquely positioned among the plethora of circuit interaction databases offered by the various EDA and ATE companies because of its device-oriented approach to data representation. This freedom from platform allegiance allows STIL to be used at any, or all, of the stages of the product test development lifecycle
Keywords
automatic test equipment; automatic test pattern generation; data structures; database management systems; design for testability; electronic engineering computing; product development; semiconductor device testing; ATE; EDA; IEEE P1450.1; STIL; circuit interaction databases; data representation; device-oriented database; product test development; test development lifecycle; test generation flow; Circuit testing; Containers; Costs; Data engineering; Databases; Discrete event simulation; Electronic design automation and methodology; Life testing; Programmable logic arrays; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805880
Filename
805880
Link To Document