DocumentCode :
3476763
Title :
An application of fuzzy logic and Dempster-Shafer theory to failure detection and identification
Author :
Kang, H. ; Cheng, J. ; Kim, I. ; Vachtsevanos, G.
Author_Institution :
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1991
fDate :
11-13 Dec 1991
Firstpage :
1555
Abstract :
An approach to failure detection and identification (FDI) is proposed which combines an analytic estimation method and an intelligent identification scheme in such a way that sensitivity to true failure modes is enhanced, while the possibility of false alarms is reduced. The authors use a real-time recursive parameter estimation algorithm with covariance resetting which triggers the FDI routine only when potential failure modes are anticipated. A possibilistic scheme based on fuzzy set theory is applied to the identification part of the FDI algorithm with computational efficiency. At the final stage of the algorithm, an index is computed-the degree of certainty-based on Dempster-Shafer theory, which measures the reliability of the decision. The FDI algorithm has been applied successfully to the detection of rotating stall and surge instabilities in axial flow compressors
Keywords :
artificial intelligence; computational complexity; failure analysis; fuzzy logic; fuzzy set theory; parameter estimation; Dempster-Shafer theory; analytic estimation method; axial flow compressors; computational efficiency; covariance resetting; failure detection; failure identification; false alarms; fuzzy logic; fuzzy set theory; intelligent identification scheme; possibilistic scheme; potential failure modes; real-time recursive parameter estimation; reliability; rotating stall instabilities; surge instabilities; Compressors; Computational efficiency; Failure analysis; Fault detection; Filters; Fuzzy logic; Fuzzy set theory; Fuzzy sets; Parameter estimation; Reliability theory; Sequential analysis; Surges;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control, 1991., Proceedings of the 30th IEEE Conference on
Conference_Location :
Brighton
Print_ISBN :
0-7803-0450-0
Type :
conf
DOI :
10.1109/CDC.1991.261666
Filename :
261666
Link To Document :
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