DocumentCode :
3476772
Title :
Advances in the measurement of the 28Si lattice parameter
Author :
Massa, E. ; Mana, G. ; Kessler, E.G.
Author_Institution :
INRIM - Ist. Naz. di Ricerca Metrologica, Torino, Italy
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
133
Lastpage :
134
Abstract :
This paper reports about the results of lattice parameter measurements aimed at determining the Avogadro constant by counting the atoms in enriched 28Si spheres.
Keywords :
lattice constants; light interferometry; silicon; 28Si; Avogadro constant; lattice parameter measurement; Atomic measurements; Crystals; Electromagnetic measurements; Lattices; NIST; Optical interferometry; Optical refraction; Optical variables control; Silicon; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
Type :
conf
DOI :
10.1109/CPEM.2010.5544280
Filename :
5544280
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3476772
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