Title :
An algorithm for diagnostic reasoning using TFPG models in embedded real-time applications
Author_Institution :
Inst. for Software Integrated Syst., Vanderbilt Univ., Nashville, TN, USA
Abstract :
Embedded diagnostic reasoners require compact modeling representations and efficient reasoning algorithms given limited available computational resources. Timed failure propagation graphs (TFPG) are compact representations used to model failure causes and progressions of conditions that are symptoms of failure occurrence, together with the temporality and likelihood of these symptom progressions and the observation of some of the aberrant conditions. Algorithms for design-time diagnosability analysis using TFPG models have previously been reported, but these algorithms have different design objectives leading to different computational strategies and optimization criteria. This paper presents and discusses an algorithm specifically designed for efficient failure isolation based on reported observations of abnormal conditions that is suitable for use in embedded real-time applications
Keywords :
diagnostic reasoning; embedded systems; engineering computing; failure analysis; graph theory; TFPG models; abnormal conditions; compact modeling representations; diagnostic reasoning algorithms; efficient failure isolation; embedded diagnostic reasoners; embedded diagnostics; embedded real-time applications; failure occurrence; online diagnosis; reported observations; timed failure propagation graphs; Algorithm design and analysis; Application software; Design optimization; Embedded computing; Embedded software; Failure analysis; Real time systems; Software algorithms; Software systems;
Conference_Titel :
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location :
Valley Forge, PA
Print_ISBN :
0-7803-7094-5
DOI :
10.1109/AUTEST.2001.949477