Title :
Application of a fault injection based dependability assessment process to a commercial safety critical nuclear reactor protection system
Author :
Elks, Carl R. ; Reynolds, Michael ; George, Nishant ; Miklo, Marko ; Bingham, Scott ; Williams, Ron ; Johnson, Barry W. ; Waterman, Michael ; Dion, Jeanne
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA
fDate :
June 28 2010-July 1 2010
Abstract :
Existing nuclear power generation facilities are currently seeking to replace obsolete analog Instrumentation and Control (I&C) systems with contemporary digital and processor based systems. However, as new technology is introduced into existing and new plants, it becomes vital to assess the impact of that technology on plant safety. From a regulatory point of view, the introduction or consideration of new digital I&C systems into nuclear power plants raises concerns regarding the possibility that the fielding of these I&C systems may introduce unknown or unanticipated failure modes. In this paper, we present a fault injection based safety assessment methodology that was applied to a commercial safety grade digital Reactor Protection System. Approximately 10,000 fault injections were applied to the system. This paper presents a overview of the research effort, lessons learned, and the results of the endeavor.
Keywords :
fault tolerant computing; fusion reactor safety; multiprocessing systems; nuclear power stations; safety-critical software; commercial safety critical nuclear reactor protection system; dependability assessment process; digital system; fault injection; instrumentation system; nuclear power generation; nuclear power plant; plant safety; processor based system; safety assessment methodology; Analog computers; Application software; Control systems; Delay; Inductors; Power engineering and energy; Power engineering computing; Power generation; Protection; Safety;
Conference_Titel :
Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-7500-1
Electronic_ISBN :
978-1-4244-7499-8
DOI :
10.1109/DSN.2010.5544285