DocumentCode :
3476968
Title :
Quantitative permittivity measurements of nanoliter fluid volumes from 50 MHz to 40 GHz with microfluidic channels
Author :
Booth, J.C. ; Orloff, N.D. ; Lu, X.L. ; Wang, Y. ; Rocas, E. ; Mateu, J. ; Collado, C. ; Janezic, M.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
353
Lastpage :
354
Abstract :
This paper describes the development of coplanar waveguide measurement structures integrated with microfluidic channels in order to rapidly determine the broadband dielectric properties of nanoliter volumes of fluids, fluid mixtures, and colloids over the range of frequencies from 50 MHz to 40 GHz. A number of different integrated microfluidic-microelectronic structures are employed in order to quantitatively determine the complex permittivity function over this wide range of frequencies. Transmission line network models are developed that use experimentally derived parameters to de-embed the response of the fluid-loaded devices, and finite-element models relate the fluid complex permittivity to the transmission line circuit parameters.
Keywords :
coplanar transmission lines; coplanar waveguides; finite element analysis; microfluidics; nanoelectronics; permittivity measurement; transmission line theory; waveguide theory; broadband dielectric properties; colloids; complex permittivity function; coplanar waveguide measurement structures; coplanar waveguide transmission lines; finite-element models; fluid complex permittivity; fluid mixtures; fluid-loaded devices; frequency 50 MHz to 40 GHz; integrated microfluidic-microelectronic structures; microfluidic channels; nanoliter fluid volumes; quantitative permittivity measurements; transmission line circuit parameters; transmission line network models; Calibration; Coplanar waveguides; Electromagnetic measurements; Electromagnetic waveguides; Frequency; Microfluidics; Permittivity measurement; Semiconductor device measurement; Testing; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
Type :
conf
DOI :
10.1109/CPEM.2010.5544289
Filename :
5544289
Link To Document :
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