• DocumentCode
    347707
  • Title

    Modeling-based examination of conducted EMI emissions from hard and soft-switching PWM inverters

  • Author

    Zhu, Huibin ; Lai, Jih-Sheng ; Hefner, Allen R., Jr. ; Tang, Yuqing ; Chen, Chingchi

  • Author_Institution
    Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1879
  • Abstract
    For the purpose of investigation of electromagnetic interference (EMI) mechanisms in hard- and soft-switching PWM inverters, empirical models and comparative experiments were studied in both time-domain and frequency-domain. Models of the major circuit components including switching devices, passive components and interconnects were obtained with physics-based device modeling and time-domain reflectometry (TDR) for parasitics characterization. The inverter simulation was then constructed using all the empirical models, and the results were compared with those from prototype experiments to examine the significant roles of parasitic elements coupled with device switching dynamics in EMI generations. With separation of common- and differential-mode EMI, the modeling approach is demonstrated to be effective over most of the EMI frequency range and the soft-switching effects on EMI are discussed
  • Keywords
    PWM invertors; electromagnetic interference; frequency-domain analysis; switching circuits; time-domain analysis; time-domain reflectometry; EMI generation; circuit components; common-mode EMI; conducted EMI emissions; device switching dynamics; differential-mode EMI; electromagnetic interference mechanisms; empirical models; frequency-domain; hard-switching PWM inverters; interconnects; inverter simulation; parasitics characterization; passive components; physics-based device modeling; soft-switching PWM inverters; switching devices; time-domain; time-domain reflectometry; Circuit simulation; Electromagnetic interference; Electromagnetic modeling; Frequency; Integrated circuit interconnections; Pulse width modulation inverters; Reflectometry; Switching circuits; Time domain analysis; Virtual prototyping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1999. Thirty-Fourth IAS Annual Meeting. Conference Record of the 1999 IEEE
  • Conference_Location
    Phoenix, AZ
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-5589-X
  • Type

    conf

  • DOI
    10.1109/IAS.1999.805995
  • Filename
    805995