DocumentCode :
347707
Title :
Modeling-based examination of conducted EMI emissions from hard and soft-switching PWM inverters
Author :
Zhu, Huibin ; Lai, Jih-Sheng ; Hefner, Allen R., Jr. ; Tang, Yuqing ; Chen, Chingchi
Author_Institution :
Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Volume :
3
fYear :
1999
fDate :
1999
Firstpage :
1879
Abstract :
For the purpose of investigation of electromagnetic interference (EMI) mechanisms in hard- and soft-switching PWM inverters, empirical models and comparative experiments were studied in both time-domain and frequency-domain. Models of the major circuit components including switching devices, passive components and interconnects were obtained with physics-based device modeling and time-domain reflectometry (TDR) for parasitics characterization. The inverter simulation was then constructed using all the empirical models, and the results were compared with those from prototype experiments to examine the significant roles of parasitic elements coupled with device switching dynamics in EMI generations. With separation of common- and differential-mode EMI, the modeling approach is demonstrated to be effective over most of the EMI frequency range and the soft-switching effects on EMI are discussed
Keywords :
PWM invertors; electromagnetic interference; frequency-domain analysis; switching circuits; time-domain analysis; time-domain reflectometry; EMI generation; circuit components; common-mode EMI; conducted EMI emissions; device switching dynamics; differential-mode EMI; electromagnetic interference mechanisms; empirical models; frequency-domain; hard-switching PWM inverters; interconnects; inverter simulation; parasitics characterization; passive components; physics-based device modeling; soft-switching PWM inverters; switching devices; time-domain; time-domain reflectometry; Circuit simulation; Electromagnetic interference; Electromagnetic modeling; Frequency; Integrated circuit interconnections; Pulse width modulation inverters; Reflectometry; Switching circuits; Time domain analysis; Virtual prototyping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1999. Thirty-Fourth IAS Annual Meeting. Conference Record of the 1999 IEEE
Conference_Location :
Phoenix, AZ
ISSN :
0197-2618
Print_ISBN :
0-7803-5589-X
Type :
conf
DOI :
10.1109/IAS.1999.805995
Filename :
805995
Link To Document :
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