• DocumentCode
    3477159
  • Title

    Improving privacy and lifetime of PCM-based main memory

  • Author

    Kong, Jingei ; Zhou, Huiyang

  • Author_Institution
    Sch. of Comput. Sci., Univ. of Central Florida, Orlando, FL, USA
  • fYear
    2010
  • fDate
    June 28 2010-July 1 2010
  • Firstpage
    333
  • Lastpage
    342
  • Abstract
    Phase change memory (PCM) is a promising technology for computer memory systems. However, the non-volatile nature of PCM poses serious threats to computer privacy. The low programming endurance of PCM devices also limits the lifetime of PCM-based main memory (PRAM). In this paper, we first adopt counter-mode encryption for privacy protection and show that encryption significantly reduces the effectiveness of some previously proposed wear-leveling techniques for PRAM. To mitigate such adverse impact, we propose simple, yet effective extensions to the encryption scheme. In addition, we propose to reuse the encryption counters as age counters and to dynamically adjust the strength of error correction code (ECC) to extend the lifetime of PRAM. Our experiments show that our mechanisms effectively achieve privacy protection and lifetime extension for PRAM with very low performance overhead.
  • Keywords
    cryptography; data privacy; error correction codes; phase change memories; PCM-based main memory; computer memory systems; computer privacy; computer threats; counter-mode encryption; encryption reuse; error correction code; lifetime extension; low programming endurance; nonvolatile nature; phase change memory; privacy protection; wear-leveling techniques; Computer science; Counting circuits; Data privacy; Delay; Elliptic curve cryptography; Error correction codes; Phase change materials; Phase change memory; Phase change random access memory; Protection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-7500-1
  • Electronic_ISBN
    978-1-4244-7499-8
  • Type

    conf

  • DOI
    10.1109/DSN.2010.5544298
  • Filename
    5544298