• DocumentCode
    3477224
  • Title

    Low-cost high-reliability assembly of thermally warped PoP with novel epoxy flux on solder paste

  • Author

    Ming Hu ; Kresge, Lee ; Ning-Cheng Lee

  • fYear
    2013
  • fDate
    11-14 Aug. 2013
  • Firstpage
    173
  • Lastpage
    181
  • Abstract
    A novel epoxy flux EF-A was developed with good compatibility with no-clean solder pastes, and imparts high reliability for BGA assembly at a low cost. This compatibility with solder pastes is achieved by a well-engineered miscibility between epoxy and no-clean solder paste flux systems, and is further assured with the introduction of a venting channel. The compatibility enables a single bonding step for BGAs or CSPs, which exhibit high thermal warpage, to form a high-reliability assembly. Requirements in drop test, thermal cycling test (TCT), and SIR are all met by this epoxy flux, EF-A. The high viscosity stability at ambient temperature is another critical element in building a robust and user-friendly epoxy flux system. EF-A can be deposited with dipping, dispensing, and jetting. Its 75°C Tg facilitates good reworkability and minimizes the adverse impact of unfilled underfill material on TCT of BGA assemblies.
  • Keywords
    ball grid arrays; reliability; solders; BGA assembly; CSP; SIR; TCT; bonding step; drop test; epoxy flux EF-A; high-reliability assembly; no-clean solder paste flux systems; thermal cycling test; thermal warpage; unfilled underfill material; venting channel; viscosity stability; Assembly; Electronics packaging; Joints; Liquids; Polymers; Powders; Reliability; BGA assembly; Epoxy flux; SMT; TCT; drop test; flux; reliability; solder paste; thermal cycling test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
  • Conference_Location
    Dalian
  • Type

    conf

  • DOI
    10.1109/ICEPT.2013.6756449
  • Filename
    6756449