Title :
Concurrent design of wideband RFIC and ESD
Author :
Xin Wang ; Bin Zhao ; Li Wang ; Ma, Ronghua ; Dong, Zhaoyang ; Zhang, Chenghui ; Wang, Aiping
Author_Institution :
Fairchild Semicond., Irvine, CA, USA
Abstract :
Robust on-chip ESD protection without RF performance degradation is a challenge in RF IC designs. This paper reviews a new co-design technique for ultra wideband (UWB) RF ICs and ESD protection so as to achieve whole-chip design optimization.
Keywords :
electrostatic discharge; integrated circuit design; radiofrequency integrated circuits; ultra wideband technology; ESD; RF IC designs; UWB; co-design technique; robust on-chip ESD protection; ultrawideband RFIC; whole-chip design optimization; wideband RFIC concurrent design; CMOS integrated circuits; Electrostatic discharges; Frequency measurement; Impedance matching; Noise measurement; Radio frequency; ESD; RF IC; UWB; co-design;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
Conference_Location :
Hong Kong
DOI :
10.1109/EDSSC.2013.6628172
