• DocumentCode
    3477358
  • Title

    Concurrent design of wideband RFIC and ESD

  • Author

    Xin Wang ; Bin Zhao ; Li Wang ; Ma, Ronghua ; Dong, Zhaoyang ; Zhang, Chenghui ; Wang, Aiping

  • Author_Institution
    Fairchild Semicond., Irvine, CA, USA
  • fYear
    2013
  • fDate
    3-5 June 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Robust on-chip ESD protection without RF performance degradation is a challenge in RF IC designs. This paper reviews a new co-design technique for ultra wideband (UWB) RF ICs and ESD protection so as to achieve whole-chip design optimization.
  • Keywords
    electrostatic discharge; integrated circuit design; radiofrequency integrated circuits; ultra wideband technology; ESD; RF IC designs; UWB; co-design technique; robust on-chip ESD protection; ultrawideband RFIC; whole-chip design optimization; wideband RFIC concurrent design; CMOS integrated circuits; Electrostatic discharges; Frequency measurement; Impedance matching; Noise measurement; Radio frequency; ESD; RF IC; UWB; co-design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
  • Conference_Location
    Hong Kong
  • Type

    conf

  • DOI
    10.1109/EDSSC.2013.6628172
  • Filename
    6628172
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3477358