Title :
A high-speed and reliable TFT integrated shift register
Author :
Zhijin Hu ; Congwei Liao ; Can Zheng ; Shengdong Zhang
Author_Institution :
Key Lab. of TFT & Adv. Display, Peking Univ., Shenzhen, China
Abstract :
A high-speed and reliable TFT integrated shift register for high-resolution display is proposed. By inhibiting the leakage current in pull-up period and enhancing the discharge ability of driving TFT in pull-down period, the operating frequency is improved by 49%. Besides, the proposed circuit is expected to have high reliability due to the lowered gate voltages on the critical TFTs biased through capacitor coupling.
Keywords :
leakage currents; semiconductor device reliability; shift registers; thin film transistors; capacitor coupling; high-resolution display; high-speed TFT integrated shift register; leakage current; operating frequency; reliable TFT integrated shift register; Discharges (electric); Reliability; high-resolution; high-speed; shift register;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
Conference_Location :
Hong Kong
DOI :
10.1109/EDSSC.2013.6628173
