DocumentCode
3477375
Title
A high-speed and reliable TFT integrated shift register
Author
Zhijin Hu ; Congwei Liao ; Can Zheng ; Shengdong Zhang
Author_Institution
Key Lab. of TFT & Adv. Display, Peking Univ., Shenzhen, China
fYear
2013
fDate
3-5 June 2013
Firstpage
1
Lastpage
2
Abstract
A high-speed and reliable TFT integrated shift register for high-resolution display is proposed. By inhibiting the leakage current in pull-up period and enhancing the discharge ability of driving TFT in pull-down period, the operating frequency is improved by 49%. Besides, the proposed circuit is expected to have high reliability due to the lowered gate voltages on the critical TFTs biased through capacitor coupling.
Keywords
leakage currents; semiconductor device reliability; shift registers; thin film transistors; capacitor coupling; high-resolution display; high-speed TFT integrated shift register; leakage current; operating frequency; reliable TFT integrated shift register; Discharges (electric); Reliability; high-resolution; high-speed; shift register;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
Conference_Location
Hong Kong
Type
conf
DOI
10.1109/EDSSC.2013.6628173
Filename
6628173
Link To Document