DocumentCode :
3477578
Title :
Joint image restoration and segmentation using Gauss-Markov-Potts prior models and variational Bayesian computation
Author :
Ayasso, Hacheme ; Mohammad-Djafari, Ali
Author_Institution :
Lab. des Signaux et Syst., CNRS-SUPELEC-Univ Paris-Sud, Gif-sur-Yvette, France
fYear :
2009
fDate :
7-10 Nov. 2009
Firstpage :
1297
Lastpage :
1300
Abstract :
In this paper, we propose a method to restore and to segment simultaneously images degraded by a known point spread function (PSF) and additive white noise. For this purpose, we propose a joint Bayesian estimation framework, where a family of non-homogeneous Gauss-Markov fields with Potts region labels models are chosen to serve as priors for images. Since neither the joint maximum a posteriori estimator nor posterior mean one are tractable, the joint posterior law of the image, its segmentation and all the hyper-parameters, is approximated by a separable probability laws using the variational Bayes technique. This yields a known probability laws of the posterior with mutually dependent shaping parameter, which aims to enhance the convergence speed of the estimator compared to stochastic sampling based estimator. Practical results are presented with comparison to a MCMC based estimator.
Keywords :
Bayes methods; Markov processes; image restoration; image segmentation; probability; variational techniques; white noise; Bayesian estimation; Gauss-Markov-Potts prior model; Potts region label; additive white noise; image restoration; image segmentation; nonhomogeneous Gauss-Markov fields; point spread function; posterior law; probability law; shaping parameter; variational Bayesian computation; Additive white noise; Bayesian methods; Convergence; Degradation; Gaussian processes; Image restoration; Image segmentation; Maximum a posteriori estimation; Stochastic processes; Yield estimation; Bayes procedures; Image Restoration; Image Segmentation; Variational Bayes Approximation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location :
Cairo
ISSN :
1522-4880
Print_ISBN :
978-1-4244-5653-6
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2009.5413589
Filename :
5413589
Link To Document :
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