Title :
Multi-frequency Test for analog circuits
Author :
Cheng Wang ; Ye Yun ; Hai-lang Liang ; Jin He ; Mansun Chan
Author_Institution :
Shenzhen SOC Key Lab., Peking Univ., Shenzhen, China
Abstract :
In this paper, multi-frequency test is presented, which can maximize differences between the failure state and the normal state of the analog circuit´s response. Using sensitivity analysis, the multi-frequency test vectors of the circuit under test(CUT) are generated and chosen. The experimental results show that this approach is very effective and highly practical for multi-frequency test vectors of the analog circuits.
Keywords :
analogue circuits; circuit testing; failure analysis; sensitivity analysis; CUT; analog circuit response; analog circuits multifrequency test; circuit under test; failure state; multifrequency test vectors; sensitivity analysis; Vectors; Analog Circuits; Multi-Frequency Test; Sensitivity Analysis; Test Vector;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
Conference_Location :
Hong Kong
DOI :
10.1109/EDSSC.2013.6628185
