Title :
The analyze and design of low FPN double delta sampling circuit for CMOS image sensor
Author :
Xiaohui Liu ; Yuanfu Zhao ; Liyan Liu ; Xiaofeng Jin ; Chunfang Wang ; Yue Zhao
Author_Institution :
Beijing Microelectron. Tech. Instn. (BMTI), Beijing, China
Abstract :
This paper presents an improved double delta sampling (DDS) circuit and the architecture and readout sequence are introduced in detail. Meanwhile, a new method to evaluate the Fixed Pattern Noise (FPN) cancellation for readout circuit before fabricated is proposed. Thus, we can evaluate DDS or other readout circuit in another view. Compared with the conventional DDS circuit, the new architecture is better overall performance. Simulation results indicate the improved DDS circuit can achieve SNR (Signal Noise Ratio) of 72.12 dB and SFDR (Spurious Free Dynamic Range) of 73.39 dB with a sampling frequency of 10MHz. Through the proposed method, we calculated that the level of FPN cancellation achieves 11.6 bits on average and 15.2 bits on maximum.
Keywords :
CMOS image sensors; analogue-digital conversion; signal denoising; signal processing equipment; CMOS image sensor; DDS circuit; FPN cancellation; SFDR; fixed pattern noise cancellation; frequency 10 MHz; low FPN double delta sampling circuit; readout circuit; signal noise ratio; spurious free dynamic range; CMOS integrated circuits; Clamps; MOS devices; Signal to noise ratio; Switches; Zinc; CMOS image sensor; Fixed Pattern Noise (FPN); column FPN; double delta sampling (DDS);
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
Conference_Location :
Hong Kong
DOI :
10.1109/EDSSC.2013.6628186