• DocumentCode
    3477836
  • Title

    DDS sources for precice measurement

  • Author

    Fu, Y. ; Li, Z. ; Zhang, Z. ; Sun, J. ; Chen, L.

  • Author_Institution
    China Jiliang Univ., Hangzhou, China
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    402
  • Lastpage
    403
  • Abstract
    DDS sources were developed in NIM for impedance measurements. Stable and accurate phase difference can be obtained easily by this technique. It has been used for mutual inductance measurements and an uncertainty of 1×10-7 has been obtained.
  • Keywords
    electric impedance measurement; inductance measurement; measurement uncertainty; DDS sources; NIM; impedance measurements; measurement uncertainty; mutual inductance measurements; phase difference measurements; Bridge circuits; Electromagnetic measurements; Frequency; Impedance measurement; Isolators; Optical fibers; Phase control; Switches; Voltage; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2010 Conference on
  • Conference_Location
    Daejeon
  • Print_ISBN
    978-1-4244-6795-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2010.5544337
  • Filename
    5544337
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3477836