Title :
DDS sources for precice measurement
Author :
Fu, Y. ; Li, Z. ; Zhang, Z. ; Sun, J. ; Chen, L.
Author_Institution :
China Jiliang Univ., Hangzhou, China
Abstract :
DDS sources were developed in NIM for impedance measurements. Stable and accurate phase difference can be obtained easily by this technique. It has been used for mutual inductance measurements and an uncertainty of 1×10-7 has been obtained.
Keywords :
electric impedance measurement; inductance measurement; measurement uncertainty; DDS sources; NIM; impedance measurements; measurement uncertainty; mutual inductance measurements; phase difference measurements; Bridge circuits; Electromagnetic measurements; Frequency; Impedance measurement; Isolators; Optical fibers; Phase control; Switches; Voltage; Voltage-controlled oscillators;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
DOI :
10.1109/CPEM.2010.5544337
