Title :
A digital blind background calibration algorithm for pipelined ADC
Author :
Shengjing Li ; Weitao Li ; Fule Li ; Zhihua Wang ; Chun Zhang
Author_Institution :
Tsinghua Nat. Lab. for Inf. Sci. & Technol., Tsinghua Univ., Beijing, China
Abstract :
This work presents a blind background calibration algorithm for correcting inter-stage gain error and capacitor mismatches in pipelined ADC. Based on the analysis of the density of specific output codes, the algorithm stores the information of the codes and needs only 80 registers. And there is no need to modify the analog circuits, which simplifies the design. Besides, since there is no multiplication or division in the digital logic, the algorithm can be implemented with a low hardware overhead, which lowers the power dissipation. For verification, a 14-bit 150MS/s ADC is fabricated in 130nm CMOS process. At 15.5MHz input signal, SDNR/SFDR improved from 66.8dB/78.57dBc to 69.7dB/87.3dBc and INL dropped from 8LSB to 3LSB after calibration.
Keywords :
CMOS logic circuits; analogue-digital conversion; calibration; digital circuits; CMOS process; capacitor mismatches; digital blind background calibration algorithm; digital logic; hardware overhead; inter-stage gain error; pipelined ADC; size 130 nm; Algorithm design and analysis; Analog circuits; Calibration; Convergence; DH-HEMTs; Estimation; Registers;
Conference_Titel :
New Circuits and Systems Conference (NEWCAS), 2015 IEEE 13th International
Conference_Location :
Grenoble
DOI :
10.1109/NEWCAS.2015.7182043