• DocumentCode
    3478799
  • Title

    Investigation of substrate resistance and inductance on deep trench capacitor for RF application

  • Author

    Kumar, Vipin ; Aminulloh, A. ; Shao-Ming Yang ; Gene Sheu

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Asia Univ., Taichung, Taiwan
  • fYear
    2013
  • fDate
    3-5 June 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A circuit analysis is introduced to detect the value of the substrate resistance and the capacitance, which is mainly caused by p-n junction diode. The effect of the substrate resistance on RF application is reported in this paper. When trench number increases the substrate resistance decreases. Effect of the inductance on the capacitor is also investigated. The inductance should be low value in the high frequency range to minimize inductance effect for Radio Frequency (RF) application. A two-port admittance parameter is used to extract the value of capacitance, inductance and substrate resistance.
  • Keywords
    capacitors; electric admittance; electric resistance; inductance; network analysis; p-n junctions; RF application; capacitance value; circuit analysis; high frequency range; inductance effect; p-n junction diode; radiofrequency application; substrate inductance; substrate resistance; two-port admittance parameter; Admittance; Capacitors; Radio frequency; Admittance; Capacitors; Circuit analysis; Inductance; P-N junction; Resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
  • Conference_Location
    Hong Kong
  • Type

    conf

  • DOI
    10.1109/EDSSC.2013.6628238
  • Filename
    6628238