DocumentCode :
3478799
Title :
Investigation of substrate resistance and inductance on deep trench capacitor for RF application
Author :
Kumar, Vipin ; Aminulloh, A. ; Shao-Ming Yang ; Gene Sheu
Author_Institution :
Dept. of Comput. Sci. & Eng., Asia Univ., Taichung, Taiwan
fYear :
2013
fDate :
3-5 June 2013
Firstpage :
1
Lastpage :
2
Abstract :
A circuit analysis is introduced to detect the value of the substrate resistance and the capacitance, which is mainly caused by p-n junction diode. The effect of the substrate resistance on RF application is reported in this paper. When trench number increases the substrate resistance decreases. Effect of the inductance on the capacitor is also investigated. The inductance should be low value in the high frequency range to minimize inductance effect for Radio Frequency (RF) application. A two-port admittance parameter is used to extract the value of capacitance, inductance and substrate resistance.
Keywords :
capacitors; electric admittance; electric resistance; inductance; network analysis; p-n junctions; RF application; capacitance value; circuit analysis; high frequency range; inductance effect; p-n junction diode; radiofrequency application; substrate inductance; substrate resistance; two-port admittance parameter; Admittance; Capacitors; Radio frequency; Admittance; Capacitors; Circuit analysis; Inductance; P-N junction; Resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
Conference_Location :
Hong Kong
Type :
conf
DOI :
10.1109/EDSSC.2013.6628238
Filename :
6628238
Link To Document :
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