Title :
On testing of static neighborhood pattern sensitive faults
Author :
Ryan, D. ; Sun, Xiaoling
Author_Institution :
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
Abstract :
This paper presents a novel scheme to test for static neighborhood pattern sensitive faults in semiconductor memories. The scheme improves the number of read operations from 18N in a classic algorithm considerably depending on the memory word length. Modifications to the original algorithm are minor, and the required built-in test hardware is minim al. The use of the Lempel-Ziv algorithm as an error detection tool is explored.
Keywords :
built-in self test; data compression; error detection; fault diagnosis; integrated circuit testing; integrated memory circuits; Lempel-Ziv algorithm; built-in test hardware; error detection tool; memory word length; read operations; semiconductor memories; sensitive faults; static neighborhood pattern sensitive faults; Built-in self-test; Circuit faults; Compaction; Hardware; Logic testing; Semiconductor device manufacture; Semiconductor device testing; Semiconductor memory; Sun; Very large scale integration;
Conference_Titel :
Electrical and Computer Engineering, 1999 IEEE Canadian Conference on
Conference_Location :
Edmonton, Alberta, Canada
Print_ISBN :
0-7803-5579-2
DOI :
10.1109/CCECE.1999.807263
