• DocumentCode
    3479035
  • Title

    UV curing and photoresist outgassing in high energy implantation

  • Author

    Jones, Mary A. ; Erokhin, Yuri ; Horsky, Tom ; Insalaco, Linda ; Whiteside, Donna ; Slater, Sydney ; Buffat, Steve ; Kickel, Bernice ; Parrill, Thomas ; Jie Xu, Jie

  • Author_Institution
    Eaton Corp., Beverly, MA, USA
  • fYear
    1996
  • fDate
    16-21 Jun 1996
  • Firstpage
    182
  • Lastpage
    185
  • Abstract
    Thick photoresists, typically 3 microns or more in thickness, necessary for high energy implantation present some unique problems. The outgassing of thick photoresist in high energy applications varies from that of thinner resist and lower energies. It requires appropriate processing to cure without reticulation of field regions, deformity of features, or blistering during subsequent processing. This paper examines different resist treatments and their effects on implanter pressure during processing. Data on outgassing of thick photoresist, outgassing effects on absolute dose and dose uniformity as measured by sheet resistance contour maps, and the variation in gas composition are presented
  • Keywords
    ion implantation; photoresists; UV curing; absolute dose; dose uniformity; gas composition; high energy implantation; photoresist outgassing; sheet resistance contour map; CMOS process; Curing; Doping; Electrical resistance measurement; Energy resolution; Implants; Instruments; Ion implantation; Resists; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology. Proceedings of the 11th International Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-3289-X
  • Type

    conf

  • DOI
    10.1109/IIT.1996.586179
  • Filename
    586179