DocumentCode
3479035
Title
UV curing and photoresist outgassing in high energy implantation
Author
Jones, Mary A. ; Erokhin, Yuri ; Horsky, Tom ; Insalaco, Linda ; Whiteside, Donna ; Slater, Sydney ; Buffat, Steve ; Kickel, Bernice ; Parrill, Thomas ; Jie Xu, Jie
Author_Institution
Eaton Corp., Beverly, MA, USA
fYear
1996
fDate
16-21 Jun 1996
Firstpage
182
Lastpage
185
Abstract
Thick photoresists, typically 3 microns or more in thickness, necessary for high energy implantation present some unique problems. The outgassing of thick photoresist in high energy applications varies from that of thinner resist and lower energies. It requires appropriate processing to cure without reticulation of field regions, deformity of features, or blistering during subsequent processing. This paper examines different resist treatments and their effects on implanter pressure during processing. Data on outgassing of thick photoresist, outgassing effects on absolute dose and dose uniformity as measured by sheet resistance contour maps, and the variation in gas composition are presented
Keywords
ion implantation; photoresists; UV curing; absolute dose; dose uniformity; gas composition; high energy implantation; photoresist outgassing; sheet resistance contour map; CMOS process; Curing; Doping; Electrical resistance measurement; Energy resolution; Implants; Instruments; Ion implantation; Resists; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Ion Implantation Technology. Proceedings of the 11th International Conference on
Conference_Location
Austin, TX
Print_ISBN
0-7803-3289-X
Type
conf
DOI
10.1109/IIT.1996.586179
Filename
586179
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