DocumentCode
3479893
Title
Mechanisms of high power laser diode
Author
Lu Guoguang ; Lai Canxiong ; Huang Yun ; En YunFei
Author_Institution
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., China Electron. Product Reliability & Environ. Testing Res. Inst., Guang Zhou, China
fYear
2013
fDate
11-14 Aug. 2013
Firstpage
761
Lastpage
764
Abstract
A fault tree of high power laser diode have been set up, include sudden failure mode, gradual degradation mode, open failure and short failure mode are analyzed in detail with several cases, some methods about improving the reliability of laser diode have been provided subsequently in this paper.
Keywords
fault trees; power semiconductor diodes; semiconductor device reliability; semiconductor lasers; fault tree; gradual degradation mode; high power laser diode; open failure mode; reliability; short failure mode; sudden failure mode; Crystals; Degradation; Diode lasers; Reliability; Semiconductor lasers; Stress; Thermal stresses; failure analysis; failure mechanisms; lifetime; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location
Dalian
Type
conf
DOI
10.1109/ICEPT.2013.6756576
Filename
6756576
Link To Document