DocumentCode :
3479953
Title :
Novel Polymer Dielectrics for Wafer Level High Density Interconnect
Author :
Yokotsuka, Shunsuke
Author_Institution :
Asahi Glass Co. Ltd., Yokohama
fYear :
2007
fDate :
Jan. 16 2007-Yearly 18 2007
Firstpage :
287
Lastpage :
289
Abstract :
Properties and processability of a new class of thermosetting fluorinated polymer are described. This polymer possesses excellent electrical properties (low dielectric constant and low dielectric loss), optical properties (low absorption and low birefringence), mechanical properties, heat stability, and chemical durability due to its fluorinated rigid backbone and highly crosslinked structure. Both dry-etch and photosensitive formulations are discussed from the viewpoint of reliability and processing requirements for wafer level high density interconnect and packaging such as thin-film formation, adhesion, planarization, stacking and fine patterning capabilities.
Keywords :
chip scale packaging; dielectric materials; integrated circuit interconnections; integrated circuit packaging; polymers; wafer level packaging; adhesion; chemical durability; fluorinated rigid backbone; heat stability; highly crosslinked structure; low dielectric constant; low dielectric loss; mechanical properties; planarization; polymer dielectrics; thermosetting fluorinated polymer; thin-film formation; wafer level high density interconnect; Absorption; Birefringence; Dielectric constant; Dielectric losses; Mechanical factors; Optical interconnections; Optical losses; Optical polymers; Resistance heating; Stability; Dry-etch; Packaging; Photosensitive; Polymer dielectrics; WL-CSP; Wafer level interconnect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Polymers and Adhesives in Microelectronics and Photonics, 2007. Polytronic 2007. 6th International Conference on
Conference_Location :
Odaiba, Tokyo
Print_ISBN :
978-1-4244-1186-3
Electronic_ISBN :
978-1-4244-1186-3
Type :
conf
DOI :
10.1109/POLYTR.2007.4339184
Filename :
4339184
Link To Document :
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