DocumentCode :
3480061
Title :
Statistical Control Of Electronic Measurements
Author :
Stein, Philip G.
fYear :
1991
fDate :
16-18 April 1991
Firstpage :
322
Lastpage :
324
Abstract :
Methods and techniques commonly used in statistical process control of manufacturing are briefly shown to be directly applicable to improvement and control of measurements. When those measurements are part of a control system and are themselves controlled in this way, considerable improvements in system performance, productivity, and quality are possible.
Keywords :
Automatic control; Control systems; Electrical resistance measurement; Feedback loop; Manufacturing processes; Noise measurement; Process control; Production; System performance; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electro International, 1991
Conference_Location :
New York, NY, USA
Type :
conf
DOI :
10.1109/ELECTR.1991.718228
Filename :
718228
Link To Document :
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