Title :
Statistical Control Of Electronic Measurements
Author :
Stein, Philip G.
Abstract :
Methods and techniques commonly used in statistical process control of manufacturing are briefly shown to be directly applicable to improvement and control of measurements. When those measurements are part of a control system and are themselves controlled in this way, considerable improvements in system performance, productivity, and quality are possible.
Keywords :
Automatic control; Control systems; Electrical resistance measurement; Feedback loop; Manufacturing processes; Noise measurement; Process control; Production; System performance; Thermal resistance;
Conference_Titel :
Electro International, 1991
Conference_Location :
New York, NY, USA
DOI :
10.1109/ELECTR.1991.718228