• DocumentCode
    3480113
  • Title

    Work in progress -test engineering program

  • Author

    Papalias, Tamara A. ; DeWilkins, William ; Harooni, Solaiman

  • Author_Institution
    San Jose State Univ., CA
  • fYear
    2005
  • fDate
    19-22 Oct. 2005
  • Lastpage
    24
  • Abstract
    A pilot program of lectures and laboratory work in mixed-signal test development engineering has been initiated at San Jose State University with support from Agilent Technologies and National Semiconductor Corporation. Class one uses bench-top equipment and a specifically-designed printed circuit board to explore the basic issues of testing: accuracy, guard bands, design for test (DfT), DSP-based tests, load board design, and the blocks of the per-pin architecture present in all manufacturing testers. Class two revisits many of the issues of class one in off-line and on-line programs for a variety of manufacturing testers. The trade-offs of accuracy versus test time are focal. This paper outlines the primary course sequence and its laboratory work
  • Keywords
    computer aided instruction; educational courses; educational institutions; electronic engineering education; integrated circuit testing; mixed analogue-digital integrated circuits; Agilent Technologies; DSP-based tests; National Semiconductor Corporation; San Jose State University; bench-top equipment; design for test; guard bands; load board design; manufacturing testers; mixed-signal test development engineering; per-pin architecture; printed circuit board; test engineering program; Circuit testing; Design engineering; Design for testability; Electrical resistance measurement; Industrial training; Integrated circuit testing; Laboratories; Semiconductor device testing; Software testing; Soldering; DSP-based test; design for test (DfT); mixed-signal test; test development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frontiers in Education, 2005. FIE '05. Proceedings 35th Annual Conference
  • Conference_Location
    Indianopolis, IN
  • ISSN
    0190-5848
  • Print_ISBN
    0-7803-9077-6
  • Type

    conf

  • DOI
    10.1109/FIE.2005.1611979
  • Filename
    1611979