DocumentCode :
3480121
Title :
Formation and growth of interfacial intermetallic layers of Sn-8Zn-3Bi-0.3Cr on Cu, Ni and Ni-W substrates
Author :
Jiaxing Liang ; Tingbi Luo ; Anmin Hu ; Ming Li
Author_Institution :
State Key Lab. of Metal Matrix Composites, Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2013
fDate :
11-14 Aug. 2013
Firstpage :
798
Lastpage :
803
Abstract :
In this paper, the formation and growth of intermetallic compounds (IMCs) of Sn-8Zn-3Bi-0.3Cr solder on Cu, Ni and Ni-W substrates have been investigated. For the Cu substrate, only Cu5Zn8 intermetallic compound was observed. For the Ni substrate, a Ni5Zn21 film formed at the interface due to the fast reaction between Ni and Zn. For the Ni-W substrate, a thin Ni5Zn21 film appeared between the solder and Ni-W layer, whose thickness decreases with the increase of W content. An amorphous bright layer was also found to form below the Ni5Zn21 layer as aging time extended, which is caused by the diffusion of Zn into Ni-W layer.
Keywords :
ageing; amorphous state; bismuth alloys; chemical interdiffusion; chromium alloys; electrodeposition; metallic thin films; soldering; solders; tin alloys; zinc alloys; Cu; Ni; NiW; SnZnBiCr; aging; amorphous bright layer; diffusion; interfacial intermetallic layers; solder; thin film; Aging; Copper; Films; Nickel; Substrates; Zinc; Ni-W barrier layer; Sn-Zn solder; interfacial reactions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location :
Dalian
Type :
conf
DOI :
10.1109/ICEPT.2013.6756585
Filename :
6756585
Link To Document :
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