Title :
A Novel Synchronous Timing Control For 200mhz Mega-bits BiCMOS SRAM at 2.5V Operation
Author :
Suzuki, A. ; Kato, H.
Author_Institution :
Semiconductor Device Engineering Laboratory, Toshiba Corp.
Keywords :
BiCMOS integrated circuits; Bipolar transistors; Capacitance; Decoding; Delay; Random access memory; Semiconductor devices; Testing; Timing; Voltage;
Conference_Titel :
VLSI Circuits, 1994. Digest of Technical Papers., 1994 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-1918-4
DOI :
10.1109/VLSIC.1994.586242
