DocumentCode :
3480370
Title :
Industrial Application of IEEE P1687 for an Automotive Product
Author :
Keim, Martin ; Waayers, Tom ; Morren, Richard ; Hapke, Friedrich ; Krenz-Baath, Rene
Author_Institution :
Mentor Graphics, Wilsonville, OR, USA
fYear :
2013
fDate :
4-6 Sept. 2013
Firstpage :
453
Lastpage :
461
Abstract :
This paper focuses on an industrial application of the proposed 1687 standard to significantly improve the test development effort and quality of test patterns for mixed signal IPs of an automotive design. The P1687 standard will enable the industry to develop test patterns for IPs on the IP level without having to know how the IP will be embedded within different designs. To measure the impact of P1687, we are applying a commercial P1687 EDA tool on an industrial 65nm automotive design. The presented results underline the significant advantages of P1687 over the current IEEE Std 1149.1-based test methodology, in both, automation of test pattern development as well as reduction of test setup data volume by more than 50%.
Keywords :
IEEE standards; IP networks; automotive components; mixed analogue-digital integrated circuits; IEEE P1687; automotive design; automotive product; commercial P1687 EDA tool; industrial application; mixed signal IP; test patterns; Automation; IP networks; Instruments; Production; Registers; Silicon; Standards; IEEE P1687; IJTAG; IP Test; Mixed-Signal Test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital System Design (DSD), 2013 Euromicro Conference on
Conference_Location :
Los Alamitos, CA
Type :
conf
DOI :
10.1109/DSD.2013.57
Filename :
6628312
Link To Document :
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