A consideration of sensitivity of non-contact PIM measurement using a coaxial probe

In this paper, PIM-sensitivity of the probe-method is evaluated in comparison with the open-ended coaxial tube method. Through a basic experiment using chip device mounted on a conductive strip, it was confirmed that the normal products does not produce prominent PIM interfering the defected-DUT detection. An experimental result using a commercial multiple-line PCB with defected connections was also presented in this paper. Through the experiment, it was also confirmed that the defected connection could be detected effectively using the probe method.