• DocumentCode
    3480807
  • Title

    Inelastic strain evolution in solder joint under thermal-mechanical coupled fatigue loading

  • Author

    Jian Lin ; Peng Gao ; Yongping Lei ; Lan Wang

  • Author_Institution
    Coll. of Mater. Sci. & Eng., Beijing Univ. of Technol., Beijing, China
  • fYear
    2013
  • fDate
    11-14 Aug. 2013
  • Firstpage
    937
  • Lastpage
    940
  • Abstract
    In SMT, it is not easy to study the failure process of solder joint under thermal-mechanical coupled fatigue loading. However, it is very important for the electrical circuit working in the thermal and vibration coupled environment. In this paper, the inelastic strain evolution in lead-free solder joint under thermal, mechanical, thermal-mechanical coupled fatigue loading was studied by numerical simulation, respectively. And the effect of amplitude and frequency of mechanical fatigue loading on inelastic strain in solder joint were investigated. It was shown that under thermal-mechanical coupled fatigue loading, there is a large value distribution of inelastic strain near the corner of the border between the chip and solder material. When the amplitude and frequency of mechanical fatigue loading are both small, the creep strain in solder joint is dominant. Otherwise, the plastic strain is larger than creep strain.
  • Keywords
    fatigue; finite element analysis; plastic deformation; solders; surface mount technology; SMT; creep strain; failure process; inelastic strain evolution; lead-free solder joint; mechanical fatigue loading; plastic strain; solder material; thermal coupled environment; thermal-mechanical coupled fatigue loading; vibration coupled environment; Creep; Fatigue; Loading; Plastics; Soldering; Strain; Thermal loading; Inelastic strain; Numerical model; SMT; Solder joint; Thermal-mechanical coupled fatigue;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
  • Conference_Location
    Dalian
  • Type

    conf

  • DOI
    10.1109/ICEPT.2013.6756614
  • Filename
    6756614