• DocumentCode
    3481008
  • Title

    Nine-Element Lumped Metal Finger Capacitor Model Extraction Method for RF Applications

  • Author

    Subramaniam, Kalavathi ; Kordesch, A.V. ; Esa, Mazlina

  • Author_Institution
    Dept. Of Radio Commun. Eng., Univ. of Technol., Skudai
  • fYear
    2006
  • fDate
    27-28 June 2006
  • Firstpage
    25
  • Lastpage
    28
  • Abstract
    The need for a good capacitor model increases as the operating frequency approaches the Gigahertz range. A good capacitor model should fairly characterize the behavior of the capacitor to include other passive characteristics such as the resistance and inductance, not to forget the parasitic elements. Presented here is a method to extract lumped element models for metal finger capacitors. The model suggested is a nine element pi circuit that includes interconnect resistance and inductance as well as substrate parasitics. This paper identifies the procedures to extract the nine element lumped metal finger capacitor model and to optimize the model to fit the measured data up to the self resonant frequency. A good fit between the modeled and measured effective capacitance and Q factor have been obtained in this work . This method can also be applied to MIM capacitors.
  • Keywords
    Q-factor; capacitors; interconnections; lumped parameter networks; MIM capacitors; Q factor; interconnect inductance; interconnect resistance; lumped element models; metal finger capacitor; nine element pi circuit; nine-element capacitor; radiofrequency applications; self resonant frequency; Capacitance measurement; Data mining; Electrical resistance measurement; Fingers; Frequency measurement; Inductance; Integrated circuit interconnections; MIM capacitors; Radio frequency; Resonant frequency; S-Parameters; Y-Parameters; capacitance; inductance; lumped elements; resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Research and Development, 2006. SCOReD 2006. 4th Student Conference on
  • Conference_Location
    Selangor
  • Print_ISBN
    978-1-4244-0526-8
  • Electronic_ISBN
    978-1-4244-0527-5
  • Type

    conf

  • DOI
    10.1109/SCORED.2006.4339301
  • Filename
    4339301