• DocumentCode
    3481134
  • Title

    Force calibration of a dual-probe nanotweezer using a mechanical lever

  • Author

    Hui Xie ; Weibin Rong ; Aiwen Wu ; Chen Yang ; Lining Sun

  • Author_Institution
    State Key Lab. of Robot. & Syst., Harbin Inst. of Technol., Harbin, China
  • fYear
    2012
  • fDate
    Aug. 29 2012-Sept. 1 2012
  • Firstpage
    134
  • Lastpage
    139
  • Abstract
    This paper presents a noncontact force calibration method in applications of the dual-probe nanotweezer. A 2 DOF mechanical lever has been developed to directly calibrate both the normal and lateral sensitivities of two optical levers used to independently measure normal and lateral forces applied on the nanotweezer. The mechanical lever is designed with a configuration of two mutually perpendicular levers, each consists of two flexible hinges, sharing a same rotational center, Each lever can convert the translation into a nanoscale rotation angle that provides an accurate conversion between the photodiode voltage output and deflective angle of a cantilever. During the calibration, a cantilever is mounted on the mechanical lever and attached on the rotational center of the flexible hinges. By making use of its nanomotion on the Z-axis and using an external motion on the barrier, this device can complete the local and full-range sensitivity calibrations of the optical levers without modifying the actual AFM or the cantilevers. Nonlinearities on both normal and lateral of the optical levers have been accurately compensated.
  • Keywords
    atomic force microscopy; calibration; force measurement; nanosensors; AFM; DOF mechanical lever; cantilever deflective angle; dual-probe nanotweezer force calibration; flexible hinges; full-range sensitivity calibrations; lateral force measurement; mechanical lever; mutually perpendicular levers; nanoscale rotation angle; noncontact force calibration method; normal force measurement; optical levers; photodiode voltage output; rotational center; Calibration; Force; Optical sensors; Optical variables measurement; Photodiodes; Probes; Sensitivity; Dual-probe nanotweezer; mechanical lever; noncontact force calibration; nonlinearity compensation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2012 International Conference on
  • Conference_Location
    Shaanxi
  • Print_ISBN
    978-1-4673-4588-0
  • Electronic_ISBN
    978-1-4673-4589-7
  • Type

    conf

  • DOI
    10.1109/3M-NANO.2012.6472971
  • Filename
    6472971